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Interactive Corporation — Японская торговая компания, основанная в 1993 году, поставляет высокотехнологичное научное и промышленное оборудование ведущих японских, европейских и американских производителей.

Interactive Corporation — Авторизованный торговый агент компаний:
JEOL Ltd., Oxford Instruments, Gatan, Rigaku, Nikon Instech, Yamazaki Mazak.
Authorized Agent of JEOL Ltd. in Russia and CIS Countries

Electron microscopes for research in area of nanotechnologies

Electron microscopes for research in area of nanotechnologies

JEM-2100F Transmission Electron Microscope

JEM-2100F Transmission Electron Microscope

The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100F is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials...

JSM-6390 Scanning Electron Microscope

JSM-6390 Scanning Electron Microscope

The JSM-6390 is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation...

JSM-6390A Scanning Electron Microscope

JSM-6390A Scanning Electron Microscope

The JSM-6390A is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for for the JSM-6390A is 35°,...

JSM-6390LA Scanning Electron Microscope

JSM-6390LA Scanning Electron Microscope

The JSM-6390LA is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for the JSM-6390LA is 35°, with...

JSM-6390LV Scanning Electron Microscope

JSM-6390LV Scanning Electron Microscope

The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm. The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot™ software ensures optimum operation...

JSM-6490 Scanning Electron Microscope

JSM-6490 Scanning Electron Microscope

The JSM-6490 is a high-performance, scanning electron microscope with a high resolution of 3.0nm. Its asynchronous five-axis mechanically eucentric stage with compeucentric rotation and tilt can accommodate a specimen of up to 8-inches in diameter...

JSM-6490LA Scanning Electron Microscope

JSM-6490LA Scanning Electron Microscope

The JSM-6490LA is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless observation and EDS analysis. The take-off-angle for the JSM-6490LA is 35°, with...

JSM-6490LV Scanning Electron Microscope

JSM-6490LV Scanning Electron Microscope

The JSM-6490LV is a high-performance, scanning electron microscope with a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for observation of specimens which cannot be viewed at high vacuum due...

JSM-6701F Scanning Electron Microscope

JSM-6701F Scanning Electron Microscope

The JSM-6701F is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution high quality imaging of micro structures....

JSM-7401F Scanning Electron Microscope

JSM-7401F Scanning Electron Microscope

The JSM-7401F, JEOL's highest resolution SEM, is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution, high quality...

JSM-7500F Scanning Electron Microscope

JSM-7500F Scanning Electron Microscope

The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest kV of any SEM available, achieving a resolution of 1.4 nm at 1...

JSM-7700F Scanning Electron Microscope

JSM-7700F Scanning Electron Microscope

The JSM-7700F is the only aberration (Cs and Cc) corrected SEM on the market. The JSM-The JSM-7700F is the only aberration (Cs and Cc) corrected SEM on the market. The JSM-7700F also offers unprecedented resolution of 0.6nm at 5kV, and...

Московское представительство компании Interactive Corporation
115191 Россия, Москва, ул. Большая Тульская, д.10, стр. 2, офис 222
тел/факс: +7 (495) 748 20 07, +7 (495) 737 51 68, e-mail: iac@microanalysis.ru